Nuur H, Munadi M, Ariyanto M. Integrating Bottleneck Attention Module (BAM) into YOLOv8 for Automated Industrial Label Quality Inspection. JETIA [Internet]. 27Apr.2026 [cited 7May2026];12(58):1170-8. Available from: https://itegam-jetia.org/journal/index.php/jetia/article/view/3281