OBJECT DEFECT DETECTION BASED ON A VISION SYSTEM WITH A MICROCONTROLLER AND AN ARTIFICIAL NEURAL NETWORK. ITEGAM-JETIA, [S. l.], v. 6, n. 23, p. 04–12, 2020. Disponível em: https://itegam-jetia.org/journal/index.php/jetia/article/view/430. Acesso em: 23 oct. 2026.