A Comparative Study of Defect Analysis, Statistical Process Control (SPC) and FMEA in Biscuits Production. ITEGAM-JETIA, [S. l.], v. 12, n. 60, p. 299–311, 2026. DOI: 10.5935/jetia.v12i60.3780. Disponível em: https://itegam-jetia.org/journal/index.php/jetia/article/view/3780. Acesso em: 22 oct. 2026.