«A Comparative Study of Defect Analysis, Statistical Process Control (SPC) and FMEA in Biscuits Production». ITEGAM-JETIA 12, no. 60 (julio 31, 2026): 299–311. Accedido octubre 22, 2026. https://itegam-jetia.org/journal/index.php/jetia/article/view/3780.