Faults Diagnostic using Hopfield Artificial Neural Network in front of Incomplete Data

Authors

  • Raquelita Torres Cabeza
  • Orestes Llanes Santiago
  • Egly Barrero Viciedo
  • Valery Moreno Vega

DOI:

https://doi.org/10.5935/2447-0228.201850

Abstract

In this work, Hopfield Artificial Neural Network’s performance in faults diagnostic in industrial process is evaluated when there is missing data. The diagnostic of two classes with different levels of overlapping data is done. As main result, Hopfield has a good performance in the implemented tests getting over architectures like the Probabilistic Neural Network, that’s why it is a good option to use it in faults diagnostic.

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Published

2018-03-31

Issue

Section

Articles

How to Cite

Faults Diagnostic using Hopfield Artificial Neural Network in front of Incomplete Data. (2018). ITEGAM-JETIA, 4(13), 77-82. https://doi.org/10.5935/2447-0228.201850