Impact of Grain Boundaries on The Electrical Characteristics and Breakdown Behavior of Polycrystalline Silicon Pin Diodes: A Simulation Study. ITEGAM-JETIA, [S. l.], v. 10, n. 49, p. 59–64, 2024. DOI: 10.5935/jetia.v10i49.1196. Disponível em: https://itegam-jetia.org/journal/index.php/jetia/article/view/1196. Acesso em: 22 oct. 2026.