«Impact of Grain Boundaries on The Electrical Characteristics and Breakdown Behavior of Polycrystalline Silicon Pin Diodes: A Simulation Study». ITEGAM-JETIA 10, no. 49 (septiembre 25, 2024): 59–64. Accedido octubre 23, 2026. https://itegam-jetia.org/journal/index.php/jetia/article/view/1196.