Impact of Grain Boundaries on The Electrical Characteristics and Breakdown Behavior of Polycrystalline Silicon Pin Diodes: A Simulation Study. JETIA [Internet]. 25 de septiembre de 2024 [citado 22 de octubre de 2026];10(49):59-64. Disponible en: https://itegam-jetia.org/journal/index.php/jetia/article/view/1196